Tescan


BRNO, Czech Republic, October 3, 2011 - TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the FERA3 XMH - a high resolution Schottky Field Emission scanning electron microscope with a fully integrated Plasma source focused ion beam.
Older News
S M T W T F S
18 19 20 21 22 23 24
25 26 27 28 29 30 1
Copyright© 2011 The Gaea Times