NXP Semiconductors Announces Live Webinar: Understanding the Risk Factors Associated with Repetitive Avalanche in Power MOSFETs

SAN JOSE, California, January 15 -

    NXP Semiconductors announces the following TechOnline Webinar:

    What:
    NXP Semiconductors Live Webinar

    When:
    Tuesday, January 19, 2010 at 11:00 am EST (8:00 am PST, 16:00 GMT)

    Where:
    seminar2.techonline.com/registration/distrib.cgi?s=1501&d=3474

    How:
    Live over the Internet -- Simply log on to the web at the address above.

    Contact:
    Rebecca Samuel, Media Relations, NXP Semiconductors, +1 408-474-8769

As Power MOSFET vendors increase the switching speed of their MOSFETs,
voltage transients related to the high di/dt, and the parasitic inductances
of PCB layouts become more difficult for the designer to control. In this
live webinar, we will examine the risk factors associated with repetitive
avalanche. Topics covered in this seminar include descriptions on potential
failure mechanisms within the MOSFET structure due to avalanche, information
on how these failure mechanisms are minimized with NXP's Trench MOSFETs, how
to avoid common application pitfalls that create avalanche, and how to
estimate the repetitive avalanche capabilities of NXP MOSFETs. Mark your
calendars!

If you are unable to participate during the live webcast, the event will
be archived at
seminar2.techonline.com/registration/distrib.cgi?s=1501&d=3474

NXP is a leading semiconductor company founded by Philips more than 50
years ago. Headquartered in Europe, the company has about 29,000 employees
working in more than 30 countries and posted sales of USD 5.4 billion
(including the Mobile & Personal business) in 2008. NXP creates
semiconductors, system solutions and software that deliver better sensory
experiences in TVs, set-top boxes, identification applications, mobile
phones, cars and a wide range of other electronic devices. News from NXP is
located at www.nxp.com.

Rebecca Samuel, Media Relations, NXP Semiconductors, +1-408-474-8769