Melexis Integrated MEMs Sensors Handle More Than Just Pressure

YPRES, Belgium, July 7, 2011 -

The MLX90807 and MLX90808 fully integrated, relative and
absolute pressure sensor die are realized with CMOS
technology combined with MEMS bulk micromachining. These
monolithic solutions are both fully automotive qualified. Each
consists of a silicon membrane with piezoresistors to transform the
stress induced by pressure into an electrical signal. An analog
signal chain interacting with a digital core, including
programmable memory, allows full calibration on chip in order to
achieve an optimized transfer function over the desired working
pressure and temperature range.

The Melexis integrated pressure sensor die cover many pressure
ranges from a span of 100mbar to several bars. Their use is
straightforward when the media to be measured is relatively benign
like dry air found in barometric sensing or engine intake
manifolds, brake boosters or even stronger media like fuel vapor.
For harsher media applications like oils, liquids and engine
exhaust gas, the Melexis chips must include special, secondary
protection for the die.

The Melexis integrated pressure sensors are proven top
performers in demanding automotive applications. The sensors meet
and exceed typical automotive industry quality standards. The
MLX90807 and MLX90808 demonstrate outstanding accuracies after
calibration in applications requiring a miniaturized, compact
pressure sensor solution. Melexis integrated pressure sensors are
fully programmable through the connector with built in protection
against all typical overvoltage automotive conditions. The
integrated sensors include circuitry meet all automotive diagnostic
requirements including broken membrane detection and short and open
circuit conditions.

The applications and capabilities of these devices address
several deficiencies found in competitive, integrated pressure
sensors. Melexis Product Marketing Manager, Laurent Otte indicates
that “experimental data from stress testing shows the MLX 90807 and
90808 are capable of having the MEMs diaphragm cycled many times in
excess of the standard test limits without failures”.  Such
results provide designers with a confidence level to allow use of
the pressure sensors in high reliability applications knowing the
chips can take the pressure. Secure too in the knowledge that in
the unlikely event of failure the chip can communicate via
diagnostics to allow for safe error handling.

• Absolute and Relative Integrated Pressure sensors
• Less than 1% error range typical overall
• Programmable through the connector (3 pins)
• Trimmable offset and sensitivity
• On-Chip Signal Conditioning
• Output proportional to pressure
• 5V analog ratiometric output
• Rail-to-rail output

Contact: Rik Moens - Melexis - rmo at melexis.com, - +32-13-670-780